Number of devices: 11
Product group: X-Ray Analysis (Search all product categories)
Page: 1
Products per page: 10 20 50
Page: 1
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Product group: X-Ray Analysis (Search all product categories)
Page: 1
Products per page: 10 20 50
20316
PANalytical Xpert Pro
PANalytical XRD-unit/X-ray diffractometer Xpert Pro. With goniometer and cooling water treatment. YoC 2004

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PANalytical XRD-unit/X-ray diffractometer Xpert Pro. With goniometer and cooling water treatment. YoC 2004
Product group: X-Ray Analysis
Provider 
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Price: 35,900.00 €
(excluding VAT)
(excluding VAT)
20237
Spectro X-Lab 2000
Spectro X-ray fluorescence spectrometer X-Lab 2000. With tray.

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Spectro X-ray fluorescence spectrometer X-Lab 2000. With tray.
Product group: X-Ray Analysis
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Price: 21,900.00 €
(excluding VAT)
(excluding VAT)
20122
Philips PW 2400
Philips/Panalytical X-ray fluorescence spectrometer XRF/RFA PW 2400/00. Rh-laser, 3 kW. Power: 400 V. 3 phases. 50 Hz. 8 kW. Computer. TFT monitor. Keyboard. Software: SuperQ 4.0M and R & D Carbon X40Y2000 V.4.0i upgrade. License. With Philips autosampler PW 2510. 120 positions. 220 V. 50/60 Hz. 110 W. CE marked. On wheels. Regularly maintained. Maintenance contract expired in March 2011.

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Philips/Panalytical X-ray fluorescence spectrometer XRF/RFA PW 2400/00. Rh-laser, 3 kW. Power: 400 V. 3 phases. 50 Hz. 8 kW. Computer. TFT monitor. Keyboard. Software: SuperQ 4.0M and R & D Carbon X40Y2000 V.4.0i upgrade. License. With Philips autosampler PW 2510. 120 positions. 220 V. 50/60 Hz. 110 W. CE marked. On wheels. Regularly maintained. Maintenance contract expired in March 2011.
Product group: X-Ray Analysis
Stock unit 
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Price: 25,800.00 €
(excluding VAT)
(excluding VAT)
19894
Spectro X-LAB 2000
Spectro X-ray fluorescence spectrometer X-Lab 2000. 230V. 1-50 kV. Vacuumpump. Computer. Software

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Spectro X-ray fluorescence spectrometer X-Lab 2000. 230V. 1-50 kV. Vacuumpump. Computer. Software
Product group: X-Ray Analysis
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Price: 18,900.00 €
(excluding VAT)
(excluding VAT)
18960
Spectro XLab Pro
Spectro X-ray fluorescence spectrometer Spectro iQ. Model XIQ11-Pd. 115/230 V. 47-63 Hz. 100 VA. Powervar ABCE800-22. Sample space diameter 60 mm. CE-marked. YoC 2006. Without computer, software, detector defective. For the repair of the equipment investment of 16.000,- Euro are required. Unit is untested and without guarantees and sold in current condition.

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Spectro X-ray fluorescence spectrometer Spectro iQ. Model XIQ11-Pd. 115/230 V. 47-63 Hz. 100 VA. Powervar ABCE800-22. Sample space diameter 60 mm. CE-marked. YoC 2006. Without computer, software, detector defective. For the repair of the equipment investment of 16.000,- Euro are required. Unit is untested and without guarantees and sold in current condition.
Product group: X-Ray Analysis
Stock unit 
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Price: 3,800.00 €
(excluding VAT)
(excluding VAT)
16531
Philips PW 2400
Philips X-ray spectrometer PW 2400. XRF-02/2062. CE-marked. Autosampler PW 2510/16. On rolls. 30-positions. 220 V. 50 Hz. 110 W. Computer. Analysis unit.

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Philips X-ray spectrometer PW 2400. XRF-02/2062. CE-marked. Autosampler PW 2510/16. On rolls. 30-positions. 220 V. 50 Hz. 110 W. Computer. Analysis unit.
Product group: X-Ray Analysis
Stock unit 
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Price: 19,800.00 €
(excluding VAT)
(excluding VAT)
16530
Philips PW 2400
Philips X-ray spectrometer PW 2400. XRF-02/2062. X-ray tube PW 2592/15. Detector MCA Flow. MCA Scint. CE-marked. Autosampler PW 2510/06. On rolls. 6-positions. 220 V. 50 Hz. 55 W. Rolein P4-Computer. Compaq monitor S700. Software UniQuant 4. Dongle. Analysis unit.

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Philips X-ray spectrometer PW 2400. XRF-02/2062. X-ray tube PW 2592/15. Detector MCA Flow. MCA Scint. CE-marked. Autosampler PW 2510/06. On rolls. 6-positions. 220 V. 50 Hz. 55 W. Rolein P4-Computer. Compaq monitor S700. Software UniQuant 4. Dongle. Analysis unit.
Product group: X-Ray Analysis
Stock unit 
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Price: 19,800.00 €
(excluding VAT)
(excluding VAT)
16454
Noran Sigma Level 2
Noran EDX-system Sigma Level 2. Complete with electronic, computer and software.

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Noran EDX-system Sigma Level 2. Complete with electronic, computer and software.
Product group: X-Ray Analysis
Provider 
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Price: 8,500.00 €
(excluding VAT)
(excluding VAT)
15930
Spectro X-Lab 2000
Spectro X-ray fluorescence spectrometer X-LAB 2000.220 V. 1500 W. Rotor with 20 positions for 34 mm pressed discs. MVF Nitrogen tank Lab 20. Dell Pentium 2-PC. Software X-Lab Pro for Windows V. 2.2 R03. With new X-ray tube. CE-marked. On rolls.

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Spectro X-ray fluorescence spectrometer X-LAB 2000.220 V. 1500 W. Rotor with 20 positions for 34 mm pressed discs. MVF Nitrogen tank Lab 20. Dell Pentium 2-PC. Software X-Lab Pro for Windows V. 2.2 R03. With new X-ray tube. CE-marked. On rolls.
Product group: X-Ray Analysis
Stock unit 
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Price: 28,200.00 €
(excluding VAT)
(excluding VAT)
15471
Spectro X-Lab 2000
Spectro X-ray fluorescence spectrometer X-Lab 2000. 230V. 1,5kW. PC Compaq. Software X-Lab Pro for windows 2.2R03e. With new detector. YoC 2000.

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Spectro X-ray fluorescence spectrometer X-Lab 2000. 230V. 1,5kW. PC Compaq. Software X-Lab Pro for windows 2.2R03e. With new detector. YoC 2000.
Product group: X-Ray Analysis
Stock unit 
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Price: 29,800.00 €
(excluding VAT)
(excluding VAT)
14525
Spectro Xepos
Spectro X-ray fluorescence Spectrometer XEPOS. With x-ray tube. HOPG-Target. PC. Printer Deskjet 840C. Software Spectro Xlab Pro 2.3. Edwards Vacuumpump RV5. Both instruments CE-marked. YoC 2001.Detector must be changed. Instrument of the previous possessor. Refittings and reorganisations are required for standard applications. The expense is enclosed approx. 30.000 EUR here. Without guarantee. As spare part donators to this exploit suitably.
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Spectro X-ray fluorescence Spectrometer XEPOS. With x-ray tube. HOPG-Target. PC. Printer Deskjet 840C. Software Spectro Xlab Pro 2.3. Edwards Vacuumpump RV5. Both instruments CE-marked. YoC 2001.Detector must be changed. Instrument of the previous possessor. Refittings and reorganisations are required for standard applications. The expense is enclosed approx. 30.000 EUR here. Without guarantee. As spare part donators to this exploit suitably.
Product group: X-Ray Analysis
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Price: 2,500.00 €
(excluding VAT)
(excluding VAT)
Page: 1
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X-Ray Analysis
Determining the structure of a crystalline substance on the atomic level is referred to as X-ray analysis or X-ray structural analysis. This is accomplished by observing the diffraction of suitable irradiations at the crystal lattice. Suitable irradiation may be mono-chromatic X-ray radiation, which can be generated by an X-ray tube. Molybdenum Kα radiation is frequently used. Its wavelength of 73.01 pm is ideally suited for diffraction at C-C bonds. Diffraction can be carried out at a monocrystal or at a crystalline powder. Monocrystal diffraction provides more precise results than diffraction at a crystalline powder. The observed diffraction pattern of the X-ray radiation allows to infer the crystal structure by means of a special computer software. From this diffraction pattern the geometry of the unit cell can be computed, which allows to deduce the array of the atoms within this unit cell. Note that with X-ray structural analysis, the radiation is diffracted at the electrons, the so-called core and valence electrons. This complicates the localisation of elements like hydrogen. Localising these elements is possible only by neutron diffraction analysis, where neutrons interact with the atomic nucleus.X-rays
X-rays are electromagnetic waves of a photonic energy between 100 eV and several MeV, and of a wavelength between 1 nm and 10-3 nm. Consequently, X-ray radiation is located in the electromagnetic spectrum between UV and gamma radiation. It was discovered by Wilhelm Conrad Röntgen, who is honoured by the German denomination of x-rays, röntgenstrahlung. The energy ranges of gamma and X-ray radiation overlap in a broad area. Their common characteristic is the fact that both are electromagnetic radiation of equal energy. They are thus physically equivalent. The difference between them is their origin. In contrast to gamma rays, X-rays originate not from processes in the atomic nucleus but from high-energy electron processes.Generation of X-ray radiation
X-ray radiation is generated in the X-ray tube. The position of the maximum is dependent on the level of the operating voltage. The X-rays in the X-ray tube are generated by strong acceleration of charged particles and by high-energy transitions in the electron shells of atoms or molecules. Both effects are used in the X-ray tube where electrons are accelerated. Afterwards, these electrons hit a block of metal, by which they are profoundly slowed, knocking other electrons out of the shells of the metallic atoms. The generated electron holes are refilled with other electrons, resulting in X-ray radiation of an energy level that is specific for the used element, the so-called characteristic X-ray radiation.Literature
- http://de.wikipedia.org/w/index.php?title=R%C3%B6ntgenstrahlung&oldid=86983003 (called: 28.03.11).
- http://de.wikipedia.org/w/index.php?title=R%C3%B6ntgenabsorptionsspektroskopie&oldid=82631152 (called: 28.03.11).
- http://www1.tu-darmstadt.de/fb/ms/fg/sf/uebung/V_210108_d_sw.pdf (called: 28.03.11).

